Arturia SEM V2 for Mac(SEM音乐合成器)

Oberheim的传奇SEM-合成器扩展器模块-作为Arturia独有的TAE®技术提供支持的高端软件仿真器，首次问世。

SEM模块最初是为补充其他合成器而制作的，但后来成为一个很好的合成器。独特的滤波器允许从低通到高通的连续可变操作，给人以前所未有的声音。当多个SEM连接到4或8语音复音系统中时，它变得很美。

平台规格

MacOS：10.10+：4 GB RAM2.5 GHz CPU。

1GB可用硬盘空间

OpenGL 2.0兼容GPU

必需的配置

适用于独立，VST 2.4，VST 3，AAX，音频单元，NKS（仅限64位DAW）。

The newest in the Applied Materials VeritySEM product family, VeritySEM 5i CD-SEM system features first-of-its-kind, in-line, 3D capabilities for high-volume metrology of logic and memory devices at the 1xnm node and beyond. Leveraging market-leading SEMVision® G6 core technology, the new system addresses the unprecedented challenges in measuring physical dimensions posed by leading-edge geometries. Its state-of-the-art, high-resolution SEM column makes possible measurements as small as 6nminnovative image enhancement algorithms aid measurement of fine pattern details. An in-column tilt-beam enables 3D FinFET metrology, while back-scattered electron (BSE) metrology addresses high aspect ratio 3D NAND structures, and BEOL via-in-trench bottom CD and characterization metrology.

FinFETs challenge traditional metrology in such measurements as gate and fin heights, whose uniformity is critical to device performance and yield. Current in-line CD SEM technology can monitor only top-view dimension variations, not those in height and slope. The VeritySEM 5i system’s in-column beam tilt remedies these issues, enabling gate and fin heights to be calculated and controlled.As technology scales down, the aspect ratios of 3D NAND memory structures are increasing to 60:1 and beyond, making accurate measurement of the bottom CD impossible using conventional metrology. High-resolution BSE imaging enhances the signal received from within these structures, allowing the VeritySEM 5i system to “see” deep into vias and trenches for precision measurement. This capability also improves metrology for via-in-trench bottom CD in BEOL processing where the desired connectivity between underlying and overlaying metal layers must be achieved to minimize via resistance.

The VeritySEM 5i system’s exceptional in-line accuracy and process control eliminate more time-consuming and costly off-line wafer cross-sectioning while helping chipmakers to streamline process development, improve device performance and yield, and shorten ramp times to high-volume production.

The VeritySEM 5i system continues to offer hands free recipe creation and full automation. An offline recipe generator (ORG) features recipe editing capabilities via an external server, enabling multiple users to create recipes from computer-aided design offline without the need for wafers. The recipes are automatically stored in the tool database. By eliminating recipe creation time loss, the ORG enables the user to maximize the tool's utilization in production.

The tool's OPC|CheckMax is a proven solution for automating the optical proximity correction (OPC) mask qualification process. As scaling proceeds below 32nm, OPC-enhanced features are commonly incorporated into mask designs for all layers. Hundreds of CD measurements are required to verify that the features printed on the wafer are indeed what the device designers intended to produce. With a suite of proprietary algorithms, OPC|CheckMax receives input from electronic design automation systems, automatically creates CD-SEM measurement recipes, and then directs the VeritySEM 5i system to measure thousands of sites at high throughput without operator assistance.

sem_wait() 减小(锁定)由sem指定的信号量的值.如果信号量的值比0大,那么进行减一的操作,函数立即返回.如果信号量当前为0值,那么调用就会一直阻塞直到或者是信号量变得可以进行减一的操作(例如,信号量的值比0大),或者是信号处理程序中断调用

sem_trywait() 和 sem_wait()是一样的,除了如果不能够对信号量立即进行减一,那么sem_trywait()就会返回一个错误(错误号是AGAIN)而不是锁定.sem_timedwait() 和 sem_wait()是一样的,除了如果减一操作不能立即执行的话,abs_timeout 指定了调用应该被阻塞的时间限制.abs_timeout 参数指向了一个结构体指定了由秒和纳秒组成的绝对的超时值:从1970-01-01 00:00:00 +0000纪元开始的UTC,结构体的定义如下:struct timespec {time_t tv_sec/* Seconds */long tv_nsec/* Nanoseconds [0 .. 999999999] */}如果超时值已经超过了调用规定的值,那么信号量不能被立即锁定,之后sem_timedwait() 为超时失败(error设置为ETIMEDOUT).

如果操作立即生效,那么sem_timedwait() 永远不会返回超时的错误,不管abs_timeout的值.更进一步的是,在这种情况下abs_timeout值的有效性都不会检查. EINTR The call was interrupted by a signal handlersee signal(7).//调用被信号处理中断

EINVAL sem is not a valid semaphore.//sem不是有效的信号量

The following additional error can occur for sem_trywait()://下面的错误是sem_trywait()可能发生的:

EAGAIN The operation could not be performed without blocking (i.e., thesemaphore currently has the value zero).//除了锁定无法进行别的操作(如信号量当前是0值).

The following additional errors can occur for sem_timedwait()://下面的错误是sem_timedwait()可能发生的:

EINVAL The value of abs_timeout.tv_nsecs is less than 0, or greater than orequal to 1000 million.//abs_timeout.tv_nsecs 的值比0小或者大于等于1000毫秒(译者注:纳秒的值不能比0小,不能比1秒大)

ETIMEDOUTThe call timed out before the semaphore could be locked.//在信号量锁定之前就超时了 对这些函数,信号处理程序总是会中断阻塞,不管是否使用了sigaction(2)的SA_RESTART标志位.

---