用扫描电镜(Jeol ISM-840 A)及装有微分析系统(连接分析AN10000)的能量弥散x-射线仪研究在故意弄皱的膜上面的沉积物。
Deposits (on intentionally fouled membranes) were investigated with scanning electronic microscopy (SEM) (Jeol ISM-840 A) and an energy dispersive xray (EDX) apparatus。。。。
an energy dispersive xray (EDX) apparatus which was combined with a microanalysis system, Link Analytical AN10000.
扫描电镜被用来研究的挤压带状samples.Specimens的断口其他地方所述的方法制备了[20]。具体来说,样本为50%RH条件下48小时内。样品很快就被冻结在2328C干冰,用锋利的刀断裂。表面裂缝的样品被安装在石墨填充磁带与goldpalladium涂真空铝存根。样本,然后用模型检查孖士打律师行的6400v扫描电子显微镜(JEOL Inc.Peabody,马萨诸塞州)。
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